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Jeol microscopes
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... "Quick and easy to operate and get high-contrast and high-resolution images." CRYO ARM™ 300 II is a cryo-electron microscope that specializes in the observation of electron beam-sensitive specimens, such as protein, for single particle ...
Jeol
... energy filter, a side-entry liquid nitrogen cooling stage and an automated specimen exchange system, is a cryo-electron microscope (cryo-EM) that enables observation of bio-molecules at cryo-temperature. The automated specimen exchange ...
Jeol
... A New Atomic Resolution Electron Microscope has been released! The "GRAND ARM™2" has been upgraded. This new "GRAND ARM™2" enables observation at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating ...
Jeol
Resolution: 0.08 nm - 0.23 nm
... technique (e-ABF: enhanced ABF), facilitating observation of light-element materials, even at low accelerating voltages. The microscope room is separated from the operation room to respond to a remote operation. In addition, JEOL products’ ...
Jeol
Resolution: 0.23, 0.19, 0.14, 0.16 nm
... JEM-F200 is a new field emission transmission electron microscope, which features higher spatial resolution and analytical performance, an easy to use new operation system for multi-purpose operation, a smart appearance, and various environmentally ...
Jeol
Resolution: 0.14 nm - 0.31 nm
... The JEM-2100Plus is a multi purpose transmission electron microscope, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior performance through intuitive operation, ...
Jeol
Magnification: 50 unit - 1,500,000 unit
Resolution: 0.1 nm - 0.31 nm
... The JEM-2200FS, a state-of-the art analytical electron microscope, is equipped with a 200kV field emission gun (FEG) and the in-column energy filter (Omega filter) that allows a zero-loss image, where inelastic electrons is eliminated, ...
Jeol
Magnification: 10 unit - 1,500,000 unit
Resolution: 0.14, 0.2 nm
... increasing. To meet those needs, a new 120 kV electron microscope “JEM-1400Flash” is equipped with a high-sensitivity sCMOS camera, an ultra-wide area montage system, and an OM (optical microscope) image linkage function. Features • ...
Jeol
... Clear visibility promotes new discovery Nowadays, not only resolution and analytical performance on the nanometer order, but also throughput in data acquisition are considered important. The newly born JSM-IT710HR is the fourth-generation model of ...
Jeol
... observation automatically • Magnify the optical image, transition to SEM image "Zeromag" The Zeromag function simplifies navigation providing a seamless transition from optical* to SEM image. The SEM, optical image ...
Jeol
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