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Resolution: 1 µm
... The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you ...
Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm
... The SU9000 II is a combination of surface-imaging SEM and intrinsic structure-resolving scanning transmission microscope (STEM) optimised for extreme resolution. This is made possible by the unique electron optics of ...
Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm
... overview: Colour navigation images of the sample plates cover the entire sample area observable by SEM - Carefree operation - collisions between the stage and SEM components are virtually eliminated by automatically ...
Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm
The HF5000 is a Cs-corrected S/TEM customisable for in-situ experiments. The special feature is provided by the Everhart Thornley SE detector, which images the surface of the sample at 60-200kV, just like in an SEM. This is particularly advantageous for ...
Magnification: 10 unit - 5,480,000 unit
Resolution: 0.7 nm - 3 nm
... dispersive X-ray spectrometer (EDS), as a common platform. The JSM-IT800 allows for the replacement of the objective lens of the SEM as a module, offering different versions to satisfy various users requirements. With the JSM-IT800, ...
Weight: 9.5 kg
Length: 613 mm
Width: 251 mm
... Modular Motorised and Manual Upright Microscopes Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. The universal microscope design ...
Nikon Metrology
... The new "Machine Vision Microscope" (MVM) is a purely digital microscope with all the features that make a microscope. It has an apochromatically highly corrected microscope objective ...
... analyzes. Entry-level inverted microscope for general purpose applications for hardness testing. Industrial and materials science inverted microscope especially designed for opaque specimens (including metals microstructure ...
Magnification: 66 unit - 1,000,000 unit
Resolution: 1.3 nm
Length: 1,716 mm
... High-speed scanning electron microscope for cross-scale imaging of large-volume specimens CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, ...
... new rf and transducer technologies of up to 400 MHz, controlled through a user friendly graphical interface. Built to semiconductor industry standards around a core platform that utilizes the latest production and research technology, ...
PVA TePla Analytical Systems GmbH
... ZTX-S series zoom microscope adopts optical imaging system,with high resolution,fine definition and strong sense of three-dimensional,easy operation.The microscope is Widely used in semiconductor and ...
... rotating turret and high quality objective lenses with long working distance. • Ideal as the microscope unit of a prober station for semiconductors. • The L- and L4-models support YAG laser wavelength ranges ...
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