Semiconductor microscopes

7 companies | 18 products
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analysis microscope
analysis microscope
DCM8

Designed to help you maximize efficiency, Leica DCM8 unites the advantages of High Definition confocal microscopy with interferometry into one versatile, dual-core system. Ultra-fast analysis is ensured thanks to one-click mode selection, ...

inspection microscope
inspection microscope
DM3 XL

Speed matters in inspection, process control, or defect and failure analysis for the microelectronics and semiconductor industry. The faster you detect a defect, the faster you can react. With a large field of view, ...

materials research microscope
materials research microscope
HF5000

Hitachi's unique 200 kV aberration-corrected TEM/STEM: the perfect harmony of imaging resolution and analytical performance 0.078 nm spatial resolution in STEM is achieved together with high specimen-tilt capability and large solid ...

polarizing microscope
polarizing microscope
ECLIPSE LV100N POL

Nikon's Eclipse polarizing microscopes are renowned for their abilitiy to produce brighter, clearer, and higher contrast images. The LV100N POL, available in diascopic and episcopic microscope illumination ...

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Nikon Metrology
research microscope
research microscope
JCM-7000 Neoscope

Magnification: 10 unit - 60,000 unit

The latest in benchtop SEM technology, the JCM-6000Plus "NeoScopeTM," is a touch panel controlled, multi functional desktop scanning microscope that answers the increasingly diversified needs among users ...

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Nikon Metrology
laboratory microscope
laboratory microscope
Eclipse LV100ND

Motorized microscope with episcopic/diascopic illumination that enables control of objectives and light intensity from camera control unit and automatically detects observation method A manual microscope ...

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Nikon Metrology
laboratory microscope
laboratory microscope
MX63, MX63L

Resolution: 1 µm

The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the ...

inspection microscope
inspection microscope
PSM-1000

Magnification: 2 unit - 100 unit

The Motic PSM-1000 is a modular microscope system that can be utilized in several applications like in the semiconductor industry, laser inspections and repairs, as well as in other applications where ...

analysis microscope
analysis microscope
SAM 400

... new rf and transducer technologies of up to 400 MHz, controlled through a user friendly graphical interface. Built to semiconductor industry standards around a core platform that utilizes the latest production and research ...

analysis microscope
analysis microscope
SAM 400 TWIN

... interface. A new master/slave concept enables arrays of two transducers to acquire simultaneous acoustic images. Built to semiconductor industry standards around a core platform that utilizes the latest production and ...

scanning acoustic microscope
scanning acoustic microscope
SAM 400 QUAD

... interface. A new master/slave concept enables arrays of four transducers to acquire simultaneous acoustic images. Built to semiconductor industry standards around a core platform that utilizes the latest production ...

measuring microscope
measuring microscope
Metrios

The first TEM dedicated to the semiconductor industry The Metrios system is the first TEM dedicated to providing the fast, precise measurements that semiconductor manufacturers need to develop and control ...