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Optical microscope FS series
measuringlong working distancefor semiconductors

optical microscope
optical microscope
optical microscope
optical microscope
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Characteristics

Type
optical
Technical applications
measuring
Other characteristics
long working distance, for semiconductors

Description

• Excellent operability with the optional inward rotating turret and high quality objective lenses with long working distance. • Ideal as the microscope unit of a prober station for semiconductors. • The L- and L4-models support YAG laser wavelength ranges from 266 up to 1064 nm allowing laser cutting of thin films and liquid crystal substrates. • Ergonomic design with combined knob for coarse- and enlarged fine focus adjustment.

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