Hitachi secondary electron microscopes
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field emission scanning electron microscopeSU8700
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.6, 0.9, 0.8 nm
Weight: 25 kg
Equipped with a 150mm sample airlock as standard, the SU8700 offers high sample throughput even for larger samples and a constantly clean sample chamber environment for low-contamination, high-resolution imaging. In addition, the sample chamber can be ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm
Weight: 970 kg
... high-performance
electron optics and analytical features, but come with different chamber and stage sizes.
The SU7000 and SU8700 are built to handle a wide range of applications. Their high brightness Schottky field emission
electron ...
Hitachi High-Tech Europe GmbH
Magnification: 5 unit - 800,000 unit
Resolution: 0.9, 2.5, 1.6, 3, 15 nm
... modular, user-friendly scanning
electron
microscope platform with variable chamber pressure capabilities.What is the SU3800/3900 family?
The Hitachi SU3800/3900 family is a modular, user-friendly scanning
electron ...
Hitachi High-Tech Europe GmbH
Magnification: 10 unit - 250,000 unit
Weight: 55, 53 kg
Length: 614, 617 mm
... Hitachi TM4000PlusIII scanning electron microscope offers a compact, user-friendly solution for imaging and elemental analysis. Designed for a range of users - from research labs to industrial quality control - this new ...
Hitachi High-Tech Europe GmbH
Magnification: 6 unit - 800,000 unit
Resolution: 15, 4 nm
Weight: 107 kg
... FlexSEM II
The FlexSEM II VP-SEM is designed for researchers and lab managers who need the capabilities of a traditional
SEM in a more compact and easier-to-operate, tabletop-like package.
With high-resolution imaging and ...
Hitachi High-Tech Europe GmbH
... high-resolution imaging and EELS - Hitachi STEM Cs corrector, fully automated - Secondary electron detector for superimposed information on sample surface in correlation to signal of transmitted electrons ...
Hitachi High-Tech Europe GmbH
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