Hitachi secondary electron microscopes

1 company | 6 products
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field emission scanning electron microscope
field emission scanning electron microscope
SU8700

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.6, 0.9, 0.8 nm
Weight: 25 kg

Equipped with a 150mm sample airlock as standard, the SU8700 offers high sample throughput even for larger samples and a constantly clean sample chamber environment for low-contamination, high-resolution imaging. In addition, the sample chamber can be ...

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Hitachi High-Tech Europe GmbH
field emission scanning electron microscope
field emission scanning electron microscope
SU7000

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm
Weight: 970 kg

... high-performance electron optics and analytical features, but come with different chamber and stage sizes.
The SU7000 and SU8700 are built to handle a wide range of applications. Their high brightness Schottky field emission electron ...

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Hitachi High-Tech Europe GmbH
scanning electron microscope
scanning electron microscope
SU3 series

Magnification: 5 unit - 800,000 unit
Resolution: 0.9, 2.5, 1.6, 3, 15 nm

... modular, user-friendly scanning electron microscope platform with variable chamber pressure capabilities.What is the SU3800/3900 family?

The Hitachi SU3800/3900 family is a modular, user-friendly scanning electron ...

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Hitachi High-Tech Europe GmbH
scanning electron microscope
scanning electron microscope
TM4000PlusIII

Magnification: 10 unit - 250,000 unit
Weight: 55, 53 kg
Length: 614, 617 mm

... Hitachi TM4000PlusIII scanning electron microscope offers a compact, user-friendly solution for imaging and elemental analysis. Designed for a range of users - from research labs to industrial quality control - this new ...

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Hitachi High-Tech Europe GmbH
scanning electron microscope
scanning electron microscope
FlexSEM II

Magnification: 6 unit - 800,000 unit
Resolution: 15, 4 nm
Weight: 107 kg

... FlexSEM II

The FlexSEM II VP-SEM is designed for researchers and lab managers who need the capabilities of a traditional SEM in a more compact and easier-to-operate, tabletop-like package.

With high-resolution imaging and ...

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Hitachi High-Tech Europe GmbH
STEM microscope
STEM microscope
HF5000

... high-resolution imaging and EELS - Hitachi STEM Cs corrector, fully automated - Secondary electron detector for superimposed information on sample surface in correlation to signal of transmitted electrons ...

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Hitachi High-Tech Europe GmbH
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