Thermo Fisher secondary electron microscopes

1 company | 9 products
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SEM microscope
SEM microscope
Phenom XL G3

Magnification: 160 unit - 200,000 unit
Resolution: 0 µm - 10 µm

... A proven large chamber SEM for rapid materials imaging and analysis The Thermo Scientific Phenom XL G3 Desktop SEM sets the stage for faster and more efficient quality control and failure analysis. Its larger stage ...

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THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
X-ray microscope
X-ray microscope
Phenom Pro G6

Magnification: 160 unit - 350,000 unit
Resolution: 8, 6, 5, 20, 10 nm
Weight: 50 kg

... Pro G6 Desktop SEM with integrated EDS for comprehensive X-ray elemental analysis. features Entry-level SEM with high-brightness CeB6 source, suited to educational and basic R&D tasks. User friendly and cost effective. Advanced ...

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THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
SEM microscope
SEM microscope
Phenom ProX G6

Magnification: 160 unit - 350,000 unit
Resolution: 8, 6 nm

... combining all the features of the Phenom Pro G6 Desktop SEM with integrated EDS for comprehensive X-ray elemental analysis. Features For advanced analytical capabilities, the Phenom ProX G6 Desktop SEM integrates ...

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THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
X-ray microscope
X-ray microscope
Phenom Pure G6

Magnification: 160 unit - 175,000 unit
Resolution: 0 nm - 15 nm
Weight: 50 kg

... advanced model, combining all the features of the Phenom Pro G6 Desktop SEM with integrated EDS for comprehensive X-ray elemental analysis. Features Desktop SEM with a durable electron source and ...

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THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
battery microscope
battery microscope
Phenom ParticleX

Magnification: 160 unit - 200,000 unit
Resolution: 0 nm - 10 nm
Weight: 75 kg

... Thermo Scientific Phenom ParticleX Battery Desktop SEM offers outstanding speed and precision. It delivers lightning-fast throughput that’s up to 10 times faster than traditional scanning electron microscopes, ...

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THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
X-ray microscope
X-ray microscope
Phenom ParticleX TC

Magnification: 160 unit - 200,000 unit
Resolution: 0 nm - 10 nm
Weight: 75 kg

... energy-dispersive X-ray spectroscopy (EDS) for advanced compositional analysis. And you can also add a secondary electron detector (SED) to collect low-energy electrons from the top surface layer of the ...

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THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
SEM microscope
SEM microscope
Phenom ParticleX AM

Magnification: 160 unit - 200,000 unit
Resolution: 10 nm

... Phenom ParticleX AM Desktop SEM comes with integrated energy-dispersive X-ray spectroscopy (EDS) for advanced compositional analysis. And you can add a secondary electron detector (SED), which collects ...

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THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
electron microscope
electron microscope
Phenom Pharos G2

Magnification: 2,000,000 unit
Resolution: 10, 3, 2, 200, 400 nm
Weight: 75 kg

... deliver these benefits in part because of its electron source. It uses a field emission gun, in which a small electro-magnetic field extracts electrons from the source. This gives you better control of the microscope ...

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THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
FIB/SEM microscope
FIB/SEM microscope
Scios 3

Resolution: 0.7, 1.2, 1.4 nm
Weight: 5 kg

... The Thermo Scientific Scios 3 FIB-SEM is an advanced, ultra-high-resolution analytical-focused ion beam scanning electron microscope (FIB-SEM). It excels in delivering exceptional sample preparation and 3D characterization ...

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THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
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