Automatic sample preparation system IM4000 II

polymerfor the laboratoryfor electron microscopy

Advanced ion milling for fast, high-quality SEM sample preparation.

• High milling rate: Fast and efficient sample preparation for hard materials
• Cross-section & flat milling: Flexible options for different applications
• Cryogenic cooling (optional): Reduces damage to temperature-sensitive samples
• User-friendly interface: Intuitive touch-screen controls for ease of use
• Optimized for SEM & AFM: Compatible with Hitachi and third-party microscopes

Overview

The Hitachi IM4000II and IM5000 ion milling systems provide high-precision sample preparation for scanning electron microscopy. Whether you're analyzing metals, semiconductors, polymers, ceramics or layered materials, these systems ensure high-quality cross-sections and surface polishing with minimal artifacts.
Designed for academic research, industrial quality control, and materials science labs, both systems deliver fast, repeatable results, making them essential for advanced electron microscopy applications.

The IM4000II is an all-in-one system for both cross-section and/or flat milling, making it a flexible option for labs needing a basic sample prep tool.

Features and benefits

Fast & précisé milling for a wide range of materials

Reduce turnaround times without compromising sample integrity.

The IM4000II achieves a 500 μm/h milling rate, while the IM5000 offers an impressive 1 mm/h or more (for Si sample with protrusion of 100 μm).

Perfect for hard materials like metals and semiconductors that need extended milling.

Cross-section & fiat milling for flexible sample préparation

Get the flexibility to prepare samples exactly how you need them.

Cross-section milling produces smooth, undistorted surfaces without mechanical stress—ideal for examining internal structures of composite materials, multilayer films, and electronic components.

Flat milling removes surface layer artifacts for high-contrast imaging, essential for applications like EBSD.

Cryogénie cooling for temperature-sensitive samples

Preserve sample integrity for high-resolution imaging.

Optional Cooling Temperature Control feature for the IM4000II and IM5000 prevents heat damage to delicate materials like polymers.

Maintains a precise temperature range (0°C to -100°C) using liquid nitrogen.

Seamless intégration with scanning electron microscopes (SEMs)

Ensure contamination-free imaging for air-sensitive samples.

Compatible with Hitachi SEMs and third-party systems for streamlined workflows.

Air protection Holder Unit (available for both IM4000II and IM5000) allows samples transfer to SEM or AFM without exposure to air.