XRF analyzer FT200 series

multi-elementprocessbenchtop

Smart coatings analysis for faster, connected measurement The FT200 Series benchtop XRF analyzers have been designed to significantly reduce the time taken to make a measurement. Recognizing that the most time is taken with sample setup and measurement recipe selection, engineers at Hitachi have created a series of ground-breaking analyzers that effectively ‘set up’ themselves, making it possible to analyze many more parts within a single shift. Automation and innovative software are what make the FT230 and FT210 analyzers. Smart Recognition modules such as Find My Part™ mean that all the operator needs to do is load the sample, confirm the part and the instrument takes care of the rest. It will find the right measurement locations on your part – even on large substrates – select the correct analysis program and send the results to your quality system. Time and human error are reduced, and you get more analysis done in less time, making 100% inspection much more realistic in a busy production environment. • Automated focusing reduces sample loading time • Find My Part™ smart recognition automatically sets the complete measurement routine • Sample view is presented over a large part of the screen for excellent visibility • Self-checking diagnostics confirms the health and stability of the instrument • Integrates seamlessly with other software and easily exports data