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Evaluation unit
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Description
This is an equipment that performs reliability assessment of samples by making the IGBT / IPM (Intelligent power transistor) / DIODE use the prescribed amount of electricity, and then performing intermittent energization at a predetermined time.
Thermal resistance measurement can also be performed at the same time. The data is sent to the host PC.
Combines IPM and DIODE testing.
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Other Hitachi High-Tech Europe GmbH products
Power device Evaluation Equipment
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