Spectroscopic ellipsometer UVISEL Plus / UVISEL Plus In-Situ

spectroscopic ellipsometer
spectroscopic ellipsometer
spectroscopic ellipsometer
spectroscopic ellipsometer
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NEW UVISEL PLUS: THE REFERENCE ELLIPSOMETER FOR THIN FILM MEASUREMENTS The new UVISEL PLUS spectroscopic ellipsometer includes the newest acquisition technology designed to measure thin film samples faster, and more accurately than ever. Based on a new electronic data processing and high speed monochromator, the new FastAcq technology enables a sample measurement from 190 to 2100nm to be completed within 3 minutes, at high resolution. The possibility to continuously adjust the spectral resolution along the measurement range enables to scan a sample smarter and faster. Designed for enhanced flexibility for thin film measurements, the UVISEL Plus offers microspots for patterned samples down to 50µm, variable angle from 40 to 90°, an automatic horizontal mapping stage and a variety of accessories, making it scalable to meet all of your application and budget needs. The easy upgradability is a hallmark of the UVISEL Plus to meet your future ongoing demanding applications. Driven by the most advanced DeltaPsi2 software platform, as well as the Auto-Soft interface featuring an intuitive workflow to speed up data collection and analysis, the UVISEL Plus allows users from novice to expert to perform thin film measurements with the highest accuracy and sensitivity. The UVISEL Plus is considered a Reference ellipsometer for ultimate materials science.


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