{{#pushedProductsPlacement4.length}} {{#each pushedProductsPlacement4}}
{{product.defLight}}
{{#if company.requestButtonsVisibility.requestButtonQuestion == "ACTIVE"}}
{{elseif company.requestButtonsVisibility.requestButtonWhereToBuy == "ACTIVE"}}
{{/if}}
{{product.productLabel}}
{{product.model}}

{{#each product.specData:i}} {{name}}: {{value}} {{#i!=(product.specData.length-1)}}
{{/end}} {{/each}}

{{{product.idpText}}}

{{productPushLabel}}
{{#if product.newProduct}}
{{/if}} {{#if product.hasVideo}}
{{/if}}
{{/each}} {{/pushedProductsPlacement4.length}}
{{#pushedProductsPlacement5.length}} {{#each pushedProductsPlacement5}}
{{product.defLight}}
{{#if company.requestButtonsVisibility.requestButtonQuestion == "ACTIVE"}}
{{elseif company.requestButtonsVisibility.requestButtonWhereToBuy == "ACTIVE"}}
{{/if}}
{{product.productLabel}}
{{product.model}}

{{#each product.specData:i}} {{name}}: {{value}} {{#i!=(product.specData.length-1)}}
{{/end}} {{/each}}

{{{product.idpText}}}

{{productPushLabel}}
{{#if product.newProduct}}
{{/if}} {{#if product.hasVideo}}
{{/if}}
{{/each}} {{/pushedProductsPlacement5.length}}
spectroscopic ellipsometer
spectroscopic ellipsometer
Auto SE

The Auto SE is a spectroscopic ellipsometer, manufactured by HORIBA Scientific. It enables automatic analysis of thin film samples with simple push button operation. In a few seconds, a complete analysis report is generated, ...

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HORIBA Scientific
spectroscopic ellipsometer
spectroscopic ellipsometer
Smart SE

The instrument Smart SE is spectroscopic ellipsometer. Very fast and accurate thin film measurement can be done with the help of it. It has the ability to characterize the thin film thickness from minute 20µm, optical ...

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HORIBA Scientific
automated ellipsometer / spectroscopic
automated ellipsometer
UVISEL 2

UVISEL 2 is a fully automated and integrated spectroscopic ellipsometer enabling accurate thin film thickness and optical constants characterization over the wavelength range 190 - 2100 nm. Sample alignment, autofocus, ...

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HORIBA Scientific
spectroscopic ellipsometer
spectroscopic ellipsometer
UVISEL Plus / UVISEL Plus In-Situ

NEW UVISEL PLUS: THE REFERENCE ELLIPSOMETER FOR THIN FILM MEASUREMENTS The new UVISEL PLUS spectroscopic ellipsometer includes the newest acquisition technology designed to measure thin film samples ...

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HORIBA Scientific
spectroscopic ellipsometer
spectroscopic ellipsometer
UVISEL 2 VUV

The UVISEL 2 VUV is a ne generation of phase modulation ellipsometer for VUV measurement. It is the main spectroscopic ellipsometer available, intended to convey the quickest thin film measurements over ...

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HORIBA Scientific
spectroscopic ellipsometer
spectroscopic ellipsometer

... array of ellipsometer like in-situ and in-line are used in controlling processes in research and in industry. From thin film monitoring to large area mapping and in-line characterization of flexible devices. In-situ spectroscopic ...

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HORIBA Scientific
spectroscopic ellipsometer
spectroscopic ellipsometer
UVISEL

The UVISEL Spectroscopic Phase Modulated Ellipsometer is a turn-key thin film metrology instrument for in-line measurement of thin film thickness and optical properties. It features rapid measurement capability with data ...

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HORIBA Scientific
laser ellipsometer / mono-wavelength
laser ellipsometer
PHE101

The PHE101 is a wavelength ellipsometer. The device has a high accuracy and repetition due to its new features. The device operates through a fast rotating analyzer. It has a powerful software consisting of materials ...

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Angstrom Advanced
spectroscopic ellipsometer / automated
spectroscopic ellipsometer
PHE 102

The PHE-102 series is a variable angle spectroscopic ellipsometer operating in the spectral range 250-1,100 nm, 250-1,700 nm or 250-2,100 nm. In the PHE-102 ellipsometer, a broad band white light source ...

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Angstrom Advanced
spectroscopic ellipsometer
spectroscopic ellipsometer
PHE 103

... software has several hundred material models. The PHE-102 ellipsometer includes all the hardware and software needed for acquiring and analyzing all sample data. In addition, PHE-103 ellipsometer software ...

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Angstrom Advanced
spectroscopic ellipsometer
spectroscopic ellipsometer
UNECS series

UNECS series is a kind of spectroscopic ellipsometers to measure the refractive index and thickness of the thin film quickly and accurately. It adopts an unique measurement method, and realizes the compact size and high-speed ...

How to choose this product

ellipsometer

An ellipsometer is a surface analytical device which measures changes in light polarization both before and after a beam is reflected from the surface to be analyzed.

Applications

Ellipsometers are used in the optical, metallurgical and microelectronics industries to measure the thickness of surface coatings, to analyze protective coatings, to measure surface roughness, etc.

Technologies

The principal types of ellipsometer are spectroscopic models, which use a broad-band light source, and laser models using a monochromatic light source.