For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds.
Push-button operation is complemented by advanced software that takes care of the work for you.
Proven spectroscopic ellipsometer technology gives you both thickness and index with much higher certainty than other techniques.
Works with your materials – dielectrics, semiconductors, organics, and more.
Spectroscopic ellipsometry for simple sample systems.
Hundreds of wavelengths simultaneously collected in seconds for immediate results.