Double ultrasonic transducer

contactdirect-contacthigh-frequency

Product overview
The dual element contact transducer series features separated transmit and receive elements for contact ultrasonic NDT. Designed for near-surface response, remaining wall thickness and corrosion/erosion inspection, these probes improve coupling on curved or rough surfaces. They are intended for use with compatible ultrasonic inspection instruments, not as standalone inspection units.

Key features

• Separated transmit and receive elements with integrated crosstalk barrier.
• Optimized for near-surface flaw detection and remaining wall thickness measurement.
• Improved coupling on curved and rough surfaces; selected configurations are contoured for curved parts.
• Reduced noise from scattering on coarse-grained materials.
• Multiple frequency options across model families (1–10 MHz).
• Connector and cable variants: Lemo 00, Microdot, fixed BNC cable, side-mounted MMD, MMD-to-BNC dual cable (model dependent).

Applications
Suitable for NDT tasks including remaining wall thickness, corrosion and erosion assessment, near-surface flaw detection, inspection of small parts (screws, bolts, pins), cladding and weld overlay inspection, bond testing, railroad wheel inspection, and detection of core flaws in shafts, bars and billets. Use contoured configurations where curved contact surfaces require enhanced coupling.

Product structure

• Dual element design: Separate transmit and receive elements for improved near-surface response.
• Crosstalk barrier: Physical separation to minimize direct feed-through between elements.
• Curved surface option: Selected models are contoured to follow curved parts for better contact.
• Connector options: Configurable with Lemo 00, Microdot, fixed BNC, side-mounted MMD or MMD-to-BNC dual cable depending on family.

Specifications

• Product type: Dual element contact transducer
• Inspection method: Contact ultrasonic inspection
• Application category: NDT and thickness measurement
• Model families: SEB; MSEB; SEB..KF; ADP; FDU
• Frequency options: 1 MHz; 2 MHz; 2.25 MHz; 3.5 MHz; 4 MHz; 5 MHz; 7.5 MHz; 10 MHz (model dependent)
• Element size examples: Round and rectangular options, e.g. 5 mm, 6 mm, 8 mm, 10 mm, 13 mm (model dependent)
• Focal distance: Approximately 3 mm to 30 mm depending on model
• Connector / cable: Lemo 00; Microdot; fixed BNC cable; side-mounted MMD; MMD-to-BNC dual cable; specific cables include SEKG2 and SEKM2 for some families
• Curved/contoured options: Available for selected configurations
• Custom configuration: Available on request

Model options

• SEB: 1 MHz, 2 MHz, 4 MHz — round and rectangular dual element configurations; typical cable SEKG2.
• MSEB: 2 MHz, 4 MHz, 5 MHz — compact dual element configurations; typical cable SEKG2.
• SEB..KF: 2 MHz, 4 MHz, 5 MHz, 10 MHz — small dual element configurations with short focal distances; typical cable SEKM2.
• ADP: 2.25 MHz, 3.5 MHz, 5.0 MHz — 6 mm, 10 mm, 13 mm element options; fixed BNC cable.
• FDU: 2.25 MHz, 3.5 MHz, 5.0 MHz, 7.5 MHz, 10.0 MHz — 6 mm, 8 mm, 10 mm, 13 mm options; side-mounted MMD; dual cable sold separately.

Integration notes
Select the model based on inspection task, required frequency, element size, focal distance and contact surface condition. Requires compatible ultrasonic inspection equipment and appropriate couplant for contact measurements. Specify connector/cable requirements or request custom configuration if needed.

Technical specifications

• Inspection method: Contact ultrasonic inspection
• Application: NDT, thickness and near-surface flaw detection
• Frequency range: 1–10 MHz (model dependent)
• Element shapes: Round and rectangular, multiple sizes
• Focal distances: ~3 mm to 30 mm
• Connector options: Lemo 00, Microdot, fixed BNC, side-mounted MMD, MMD-to-BNC
• Model families: SEB, MSEB, SEB..KF, ADP, FDU
• Customization: Contoured probes and custom configurations on request