Spring contact probe

Probe pins are used in many of our products, not only in connectors, but also in test sockets, image sensor sockets, high-frequency probe pin sockets, etc. They are used for performance inspection of semiconductor devices and substrates. Our lineup includes a wide variety of outer diameters, lengths, and tip shapes. In addition, there are many products that can be used for special applications such as high temperature, large current, Kelvin connection type, plunger integrated type, non-magnetic type, etc. We will propose products with specifications that match your equipment. Please contact us for custom design consultations and quotes.