Monitoring analyzer EA-300

elementalbenchtopautomated

Observe and Instantly Identify Materials One-click elemental analysis No pre-processing or vacuum required Automatically identify materials Introducing an elemental analyzer for use with VHX microscopes. Simply place the target on the stage to perform elemental analysis with no destruction, deposition, or vacuum required. AI-based recommendations make it possible for anyone to identify materials or foreign substances. Identify Substances Directly from Your Microscope Place-and-Analyze Operation One-click elemental analysis is possible. Users can easily go from magnified observation to elemental analysis without needing to re-align or focus the laser objective lens. No Pre-Processing or Vacuum Required Non-destructive, alteration-free analysis is possible on targets of any size. No conductivity treatment or vacuuming is required for analysis. Automatically Identify Materials Nanosecond laser pulse / Plasma emission The detected elements are analyzed. An integrated AI function will recommend the most likely detected material. The database can also be used to collect historical in-house analysis results for reference when similar foreign particles are detected.