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  1. Metrology - Laboratory
  2. Analytical Instrumentation
  3. Automatic probe
  4. LANG

Measurement probe Probe Z-Nano
automaticrugged

Measurement probe - Probe Z-Nano - LANG - automatic / rugged
Measurement probe - Probe Z-Nano - LANG - automatic / rugged
Measurement probe - Probe Z-Nano - LANG - automatic / rugged - image - 2
Measurement probe - Probe Z-Nano - LANG - automatic / rugged - image - 3
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Characteristics

Domain
measurement, automatic
Other characteristics
rugged

Description

The tool setting probe Z-Nano is a cablebound measuring system which allows fast, precise and automatic tool length measurement and broken tool detection in machining centers. It´s rugged machanical design and the optoelectrinic signal generation via an integrated light barrier guarantees highest reliability under roughest conditions.

Catalogs

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Exhibitions

Meet this supplier at the following exhibition(s):

SPS 2026
SPS 2026

24-26 Nov 2026 Nuremberg (Germany) Hall 1 - Stand 570

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    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.
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