Test probe

vacuummeasurementcontact

According to clients’ solar cell or sample type and pattern design to provide perfect and suitable testing fixture, probe platform and temperature control platiorm which can make sure the sample with excellent contact , accurate measurement and avoiding the measured error for Fill Factor (FF), Open-voitage(Voc) and shortcut current(Isc). Also it can be design with 2 or 4 wires measurement. Crystalline silicon solar cell and insulating substrate device: Commonly used for:mono-Si, poly-Si, a-Si,CIGS, GaAs Our platform can configure with two or four magnetic probers that can provide high resolution movement (2 ym) in three dimensions (X, Y. Z). The reference solar ceil or standard detector also can be included on the platform for calibration Vacuum Chuck Option A platform with vacuum holes holds the test device and makes electrical excellent contact to its rear surface. Also the vacuum chuck can be design for multi-eection or different section. Temperature Control Option With the Peltier and thermoelectric based temperature control, faster responsive- ness and temperature precision are achieved. The range of temperature contro! for test device ranges from 15°C to 65°C. The temperature accuracy is less than 1°C.Or other customized temperature range and accuracy. For Multi-busbars Solar Cell Option Two or three probing bars (standard; also can configure with 4, 5 or others) with adjustable spacing and containing multiple spring-loaded probes contact the busbars on the top of the test device. The platform are suitable for 4, 5, Ginch solar cell and also can configure with vacuum, pneumatically controlled bars and temperature control.