Impulse voltage test system PST6747Ai series

for research and developmentlaboratoryfor OEM

Product Overview
The PST6747Ai series is a semiconductor testing system for precise measurement and analysis of static parameters of power semiconductor devices. It supports up to 3 kV (10 kV optional) and 2200 A, fast pulse operation and fA‑level current detection, enabling characterization of modern devices including IGBT, GaN and SiC.

Models

• PST6747Ai: high accuracy, aimed at research and development; test reports include detailed characteristic curves and parameters.
• PST6747Ai-F: high accuracy for factory product testing before delivery; reports suitable for inclusion in user documentation.
• PST6747Ai-L: standard accuracy for incoming material/supplier testing; reports comparable to manufacturer reports for easier comparison.

Modular Design and Hardware
The series uses a modular architecture with independent high‑precision source modules such as P6701B (3 kV high‑voltage source), P6703B (precision source) and P6705A (2200 A high‑current source). Each power module integrates two separate AD converters with 2 µs sampling rate. Module drives are independently controllable and key timing events are monitored precisely to capture timing‑sensitive characteristics.

Software and Data Management
Included software simplifies measurement control and data management; it is customizable to user workflows and supports export of detailed reports and measurement logs.

Applications
Designed for static parameter measurement of power semiconductor devices and power circuit components. Typical use cases: R&D characterization, factory product testing, and supplier/material comparison for IGBT, GaN, SiC devices.

Technical specifications

• Measurement voltage: up to 3 kV standard (10 kV optional).
• Measurement current: up to 2200 A.
• Supports fast pulse testing and fA‑level current detection.
• Wide voltage and current measurement range suited to modern power devices.
• Modular design with independent high‑precision source modules (examples: P6701B, P6703B, P6705A).
• Two separate AD converters per power module with 2 µs sampling rate.
• Independent, accurate drive control per module; precise timing monitoring.
• Three available models: PST6747Ai, PST6747Ai-F, PST6747Ai-L (differ by accuracy and target application).
• Customizable software for measurement control and data management.
• Applicable to testing IGBT, GaN, SiC and other emerging power semiconductor devices.