surface inspection microscope / Raman / benchtop / confocal
inVia™

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surface inspection microscope surface inspection microscope - inVia™
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Characteristics

  • Technical applications:

    for surface inspection

  • Type:

    Raman

  • Ergonomics:

    benchtop

  • Observation technique:

    confocal

  • Other characteristics:

    real-time

Description

inVia - the ultimate research-grade confocal Raman microscope.

It is simple to operate yet delivers outstanding performance and reliable results, for even the most challenging experiments. You can produce both rich, detailed, chemical images and highly specific data from discrete points. With unparalleled flexibility, scientists and engineers, worldwide, trust inVia.

Performance you can rely on

The highly efficient optical design gives you the best Raman data, from minute traces of material and large volumes. Apply this power to your experiments, running measurements such as:

time series: monitor how your sample is altering with time
temperature ramps: use a hot/cold cell to see phase changes
line scans: profile your sample, both across the surface, or into its depth
area mapping: generate images, either horizontally at fixed focus, following the surface topography, or from vertical slices
volume scans: produce 3D views of your transparent sample's internal structure
transmission mapping: analyse large volumes of material and produce depth-averaged 2D images of bulk material homogeneity
specialist measurements: trigger data collection from your own equipment (such as a control system on a synchrotron beamline)