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Surface inspection microscope inVia™ Qontor®
Ramanbenchtopconfocal

surface inspection microscope
surface inspection microscope
surface inspection microscope
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Characteristics

Technical applications
for surface inspection
Type
Raman
Ergonomics
benchtop
Observation technique
confocal
Other characteristics
high-speed, real-time

Description

The new inVia Qontor is Renishaw's most advanced Raman microscope. With the addition of Renishaw's latest innovation, LiveTrack™ focus tracking technology, the inVia Qontor enables users to analyse samples with uneven, curved or rough surfaces. Optimum focus is maintained in real time during data collection and white light video viewing. This removes the need for time consuming manual focusing, pre-scanning or sample preparation. The inVia Qontor confocal Raman microscope's cutting-edge technology reduces overall experiment times and makes analysing even the most complex samples easy. Keep your view of the sample in focus while you survey it under manual control Raman-map rough, uneven, and curved surfaces Little or no sample preparation is required View Raman chemical images in 3D and see both the chemistry and the topography No need for a time-consuming surface pre-scan Maintain focus during dynamic measurements, such as sample heating/cooling and during very long measurements when the environmental conditions are varying

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.