Process analyzer SSD-MSF

X-ray

SSD-MSF Rigaku’s SSD-MSF is an X-ray stress analyzer equipped with the D/teX Ultra1000 1D semiconductor detector which uses X-rays to non-destructively measures the residual stress accumulated in a material during the manufacturing process. The auto Z-axis stand enables measurement of samples large and small with simple operation. This stress analysis instrument has twenty times faster measurement speed than that of scintillation counters and twice that of position-sensitive proportional counters (PSPC’s). High-sensitivity, high-energy resolution, one-dimensional semiconductor detector D/teX Ultra1000 The D/teX Ultra1000 provides profiles with high peak to background ratio and detection efficiency of 1.7 times higher than conventional PSPC’s. Any sample size from large structures to small samples The auto Z-axis stand expands the measurable sample size up to 1100 mm in height and up to 530 mm in arm length.