Specimen test fixture

for current probefor electronicsplug-and-play

Seiken Probe Holders (Pin Blocks / Pin Jigs) Precision, Stability, and Reliability for Every Test In semiconductor and electronic component testing, accuracy begins with stable contact. Seiken’s Probe Holders—also known as pin blocks, pin jigs, probe blocks, or pin boards—are precision-engineered to ensure secure, repeatable contact between test probes and device electrodes. These fixtures form the foundation for reliable electrical measurements, minimizing alignment errors and improving overall testing consistency. Whether you’re conducting IC socket testing, PCB inspection, or high-current evaluation, Seiken’s custom probe holders provide the stability and precision your testing environment demands. Trusted by engineers and researchers across industries, our holders are built to streamline test operations, reduce downtime, and enhance throughput—all while maintaining the highest levels of accuracy. As both a probe manufacturer and fixture designer, Seiken provides complete, integrated test solutions—including custom wiring, connectors, and system-ready interfaces. From single components to turnkey testing systems, we deliver tailored probe holder solutions for any application. •Reliable Contact: Designed to prevent probe misalignment and ensure stable, repeatable measurements. •High Precision: Enables accurate electrical testing across a wide range of device geometries and fine-pitch layouts. •Enhanced Efficiency: Improves setup speed, reduces handling time, and boosts inspection productivity. Key Features & Advantages •Custom designs for advanced testing needs: Precision-built fixtures for high-temperature, non-magnetic, and specialized testing environments. •Cross-industry compatibility: Proven performance in semiconductors, automotive electronics, medical devices, and advanced material research. •Scalable production: From prototyping to mass production, our flexible process ensures consistent quality and fast delivery. •Integrated solutions: Combine with Seiken’s contact probes, Kelvin probes, or manual press systems for a seamless inspection setup. Application Examples •Semiconductor packages and IC sockets •PCB and module testing •MLCCs, inductors, and discrete components •Connector testing and automated inspection jigs •Customized component handling or positioning fixtures Beyond testing, Seiken’s probe holders serve as miniature electrode pins in compact devices such as wearables and earbuds, and as spring-loaded holders for vacuum transport and tray alignment. Featured Projects - Connector Testing Fixtures: Custom jig heads for connector inspections and automated testing setups, supporting the shift from connector-to-connector to probe-pin contact methods. - MLCC Testing (Multilayer Ceramic Capacitors): Proven in the evaluation of automotive-grade MLCCs, offering durability and repeatability for development and production. - Beyond Testing: Probe holders and pins are also used as miniaturized electrode pins for space-limited devices (e.g., wearables, earbuds), and for holding & positioning devices during vacuum transport or tray handling due to their spring characteristics. Technical Specifications / Features •Fully customizable probe holder design for various testing needs •Material options: resin, metal, and hybrid structures •Ensures high-precision, repeatable measurements •Supports integrated wiring and signal connectors •Compatible with high-temperature, non-magnetic, and vacuum test environments •Flexible manufacturing: from prototypes to production runs •Used across semiconductor, electronics, automotive, medical, and R&D industries