Manual press

electronictestfor industrial applications

Seiken Manual Press Machine Reliable, High-Precision Manual Test Fixture for Semiconductor and Electronic Component Testing When precision and reliability matter, Seiken’s Manual Press Machine delivers consistent electrical contact performance for IC socket testing, PCB inspection, and high-current device evaluation—all in a compact, user-friendly tabletop system. Designed for low-volume production, R&D environments, and prototype testing, this lever-operated manual press provides stable, repeatable contact without the complexity or cost of automated handlers. With just a single downward motion, users can achieve precise probe engagement and accurate measurements—ideal for laboratories, small production lines, and testing environments where space and flexibility are key. Engineered for Precision, Built for Flexibility Seiken’s manual press system combines fine mechanical control with customizable probe configurations, supporting a wide range of semiconductor devices, printed circuit boards (PCBs), and flexible substrates. Each unit can be tailored to your specific device geometry, ensuring optimal contact accuracy and measurement stability even for uneven or complex surfaces. Core Structure: •Press Frame: Applies consistent, controlled downward force through a smooth lever-driven mechanism. •Pin Board: Holds Seiken’s precision contact probes and ensures perfect alignment with the test target. •Stage: Firmly secures the device under test, maintaining position and stability during contact. Optional integrations include signal connectors, vacuum holding systems, and XYθ adjustments, allowing for higher precision and ease of operation in demanding test conditions. Key Features & Advantages •Compact design: A tabletop manual test fixture that fits seamlessly in small labs or limited workspaces. Operate easily with a single lever motion. •Versatile and cost-efficient: Replaceable pin boards and stages enable multiple test setups on one system—reducing cost and setup time. •Fully customizable: Adjustable for fine-pitch testing, non-magnetic environments, and unique device shapes or sizes. • Maintenance-friendly: Quick probe replacement and easy access to components minimize downtime and ensure long-term reliability. •Backward compatibility: Retrofit and upgrade existing Seiken press systems or integrate with third-party frames. •Dual-side contact: Optional top-and-bottom probe configuration for multi-layer testing and complex circuit evaluation. •Ultra-fine machining: Supports fine-pitch probes with precision-drilled hole patterns for micro-scale connections. •Function checker integration: Complete turnkey systems including control boards, signal wiring, and electrical enclosures, custom-built in collaboration with IMI. Application Examples •Semiconductor device testing — including packaged ICs and high-current modules •PCB and flexible circuit inspection •Component evaluation and function checking for R&D and academic research •Custom electronic inspection systems Technical Specifications: •Operation: Manual, lever-operated press mechanism •Structure: Press Frame / Pin Board / Stage •Options: Signal connectors, vacuum holding, XYθ stage adjustments •Customization: Compatible with fine-pitch and high-current applications •Design: Compact, tabletop unit for low-volume or prototype testing •Maintenance: Quick probe replacement •Compatibility: Backward upgradeable to existing Seiken or third-party press frames