Optical spectrometer S200-MF
compactgrating

optical spectrometer
optical spectrometer
optical spectrometer
optical spectrometer
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Characteristics

Type
optical
Configuration
compact
Other characteristics
grating
Wavelength

Max.: 1,100 nm

Min.: 200 nm

Description

S200-MF is a spectrometer with high spectral and spatial resolution across the entire area of commercially available 2D (array) image sensors. • Ideal astigmatism compensation across the entire focal plane; • Synchronous spectra imaging from two up to dozens optical fibers; • Integrated CCD-array and custom software for multichannel optical spectroscopy; • Embedded mechanical shutter synchronized with the detector for processing continuous signals; • Perfect system for hyperspectral imaging. Due to innovative optical bench and specially designed optics with aberration correction the S200-MF spectrometer features complete compensation of astigmatism both in the center of detector’s sensitive area and at its edges. This allows connecting a multi-fiber optical bundle to the entrance slit of the spectrometer and acquiring spectra from several fibers simultaneously. Maximum number of optical fibers in the bundle depends on the height of sensor area and on fiber diameter. When using standard sensors as large as 6 mm tall a number of simultaneously analyzed fibers may reach several dozens. S200-MF has a fixed entrance slit and can operate either with optical fibers, or without them. At direct input of radiation into the spectrometer an image from the analyzed area is projected directly on the entrance slit, and the detector acquires spectral information from this area with high spatial resolution.
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.