X-ray diffractometer Xstress G2

laboratoryportable

The Xstress G2 X-ray diffractometer represents advances in design and construction which provide enhanced reliability and function in a truly portable residual stress and retained austenite analyzer. • Non-destructive • Suitable for laboratory, factory and ­field use • Quick assembly, ready to use in 10 minutes • Easy replacement of X-ray tube (Cr, Cu, Co, Fe, V, Ti, Mn) which enables measuring different materials • Measurement distance 50 mm • Two NMOS position sensitive detectors • Instantly adjustable 2θ-angle • XTronic software for running the measurement and calculating residual stresses and retained austenite content (optional) • d-sin²χ and Ω-measurement modes as a standard Features • Two symmetrically positioned NMOS position sensitive detectors • standard detector width 15° • for other detectors see options • 2θ-range of the detectors • continuously adjustable within 110° to 165° • lower angles as option with special detector arcs • Standard measurement distance 50 mm • Replaceable collimators • 1/2/3/4/5 mm spot sizes • special collimators available as an option • X-ray tube • Cr-tube as standard: max. output 30 kV/9 mA/270 W • Xstress main unit (high voltage generator) • X-ray power supply 5–30 kV/0–10 mA freely adjustable within limits • self-contained liquid cooling system • includes all interlocks required for complete safety • universal power input