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Semiconductor test system ETS-88automatic
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Characteristics
- Applications
- for semiconductors
- Other characteristics
- automatic
Description
The ETS-88 Test System is optimized for high throughput, low cost of test for a single site, as well as multi-site and index parallel applications.
- High throughput test system
- Low cost of test for single site and multi-site applications
- Optimized for index parallel applications
Key Features:
- Designed for high-volume production environments
- Supports both single-site and multi-site testing
- Flexible architecture for various test requirements
- Cost-effective solution for semiconductor testing
Technical Specifications / Features:
- Product Name: ETS-88
- Manufacturer: Teradyne
- Application: Semiconductor test system
- Optimized for: High throughput, low cost, single/multi-site, index parallel
Exhibitions
Meet this supplier at the following exhibition(s):
Other Teradyne products
Precision Power & Analog Test
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.
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