Flatness interferometer Verifire Asphere+
calibrationfor thickness measurementlaser

flatness interferometer
flatness interferometer
flatness interferometer
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Characteristics

Applications
flatness, calibration, for thickness measurement
Options
laser, Fizeau, high-resolution, high-accuracy, automated, large aperture

Description

Aspheric optics enable significant benefits in the design and implementation of imaging, sensing and laser systems used in industries from defense & aerospace, semiconductor exposure and inspection systems and medical imaging systems. Production of aspheres that support these applications is dependent on precision metrology. After all, when it comes to aspheric optics, you can’t make what you can’t measure. The Verifire Asphere+ (VFA+) leverages the benefits of Fizeau interferometry to provide a unique combination of precise, high resolution, fast, and full aperture metrology for axisymmetric aspheres. The VFA+ provides a flexible metrology platform to measure a range of axisymmetric aspheres with only a change of the transmission sphere. The VFA+ is equipped with an optional secondary stage which supports a computer generated hologram (CGH) extending the asphere shape capability to nonsymmetric freeforms and off-axis aspheric optics. NEW! With a focus on enhancing the user experience, you can easily set up new measurements, navigate measurement data & results, and diagnose production issues. Mx™ Software enables efficient R&D and prototyping phases and improves production applications with simple one-click setup, alignment and measurement capabilities. • Adaptable to multi-part automated measurement of trays of optics • Utilize as “normal” Fizeau interferometer with extreme-precision radius of curvature rail • Cost effective asphere metrology solution that is future compatible – upgrade existing VFA systems to VFA+!

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.