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- High-precision coordinate measuring machine >
- ZEISS
ZEISS high-precision coordinate measuring machines
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X travel: 500 mm
Y travel: 500 mm
Z travel: 500 mm
... Quality assurance is demanding and CMM requirements are high – especially in the production environment. ZEISS DuraMax combines robustness, precision and efficiency, making it the perfect choice for at-line ...
ZEISS Métrologie et Microscopie Industrielle
... Benefits Computer-Aided Accuracy: Measuring errors due to dynamically induced inertia effects are automatically compensated for ZEISS air bearings on four sides guarantee stability and precision ZEISS ...
ZEISS Métrologie et Microscopie Industrielle
X travel: 700 mm - 1,200 mm
Y travel: 700 mm - 2,400 mm
Z travel: 600 mm - 800 mm
... the measuring time to a minimum while maintaining reliable accuracy. This is guaranteed by functions such as ZEISS VAST navigator or ZEISS VAST performance in conjunction with ZEISS VAST measuring heads. Small ...
ZEISS Métrologie et Microscopie Industrielle
X travel: 700 mm - 1,600 mm
Y travel: 900 mm - 4,200 mm
Z travel: 500 mm - 1,000 mm
... on the market for over 30 years, ZEISS PRISMO reliably and reproducibly achieves maximum accuracy. Boasting the fastest measuring speeds of any ZEISS CMM, it is ready for deployment in a range of different environments – with the ZEISS ...
ZEISS Métrologie et Microscopie Industrielle
X travel: 900 mm
Y travel: 1,500 mm
Z travel: 700 mm
... wherever maximum precision is demanded – in the measuring labs of research institutes, the aerospace industry and the optical industry. The high-end machine combines precision ...
ZEISS Métrologie et Microscopie Industrielle
... the coordinate measuring machine with large workpieces Enlarged measuring performance REACH CFX 3 MMZ stylus extensions for measuring ...
ZEISS Métrologie et Microscopie Industrielle
... Large bridge-type machines in the ZEISS MMZ G line meet the highest demands: they feature the largest measuring range of all measuring machines offered by ZEISS and offer ...
ZEISS Métrologie et Microscopie Industrielle
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