Atomic force microscope LensAFM

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The Nanosurf LensAFM is an atomic force microscope that picks up where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can also be used to analyze various physical properties of a measurement sample. Seamless Integration In an ever-increasing number of situations, researchers are looking to combine optical and atomic force microscopy techniques. The ease of use, screening capability, and minimal sample preparation requirements of optical microscopes are almost unparalleled. However, when the resolution of a 100x objective is not sufficient to examine small features beyond the instrument's resolution, the LensAFM comes into play. Its exceptionally small design and clever mounting mechanism mean you only need to rotate the turret on your optical microscope or profilometer and run the scan. Enhance Your Optical Microscopy with AFM for Advanced Insights Since the resolution of optical microscopy is limited by the wavelength of light, there is a barrier in the resolution you can achieve with your optical system. In an ever-increasing number of applications, this calls for the combination of optical and atomic force microscopy. In addition, AFM overcomes problems characterizing transparent samples or samples otherwise difficult to assess optically. But not only the coarse topography of a sample is of interest: AFM also allows knowledge of other material properties to be acquired,