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Measuring microscope NaioAFM
surface roughnesseducationalfor surface inspection

measuring microscope
measuring microscope
measuring microscope
measuring microscope
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Characteristics

Technical applications
measuring, surface roughness, educational, for surface inspection
Type
atomic force
Ergonomics
benchtop, compact, portable
Other characteristics
digital camera, high-resolution, simple installation
Resolution

Min.: 14 µm

Max.: 70 µm

Description

The leading AFM for nanoeducation Compact and robust Easy to use Real value for money The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.