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measuring microscope / surface roughness / educational / for surface inspection
NaioAFM

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Characteristics

  • Technical applications:

    measuring, surface roughness, educational, for surface inspection

  • Type:

    atomic force

  • Ergonomics:

    benchtop, compact, portable

  • Other characteristics:

    digital camera, high-resolution, simple installation

  • Resolution:

    Min.: 14 µm

    Max.: 70 µm

Description

The leading AFM for nanoeducation
Compact and robust
Easy to use
Real value for money
The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.