Atomic force microscope NaioAFM

for surface inspectionmeasuringsurface roughness

The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place. • All-in-one plug-and-play AFM system • All standard operating modes • Famously easy to use All-in-One Plug-and-Play AFM System The NaioAFM system consists of only the scan head mounted on a small vibration isolation platform with integrated controller. It takes only a few minutes to set up and prepare for a measurement. Ideal for a university course or classroom setting, the NaioAFM is robustly designed and insensitive to careless handling by novice users, yet performs well on a large variety of samples.   All Standard Operating Modes NaioAFM boasts a versatile selection of measurement modes, despite its basic design. NaioAFM is capable of measuring in all standard operating modes, and it can even perform basic electrical characterization and basic force spectroscopy. If you are learning AFM, or require only basic AFM functionality for your research, the NaioAFM has been the instrument of choice for more than a decade.   It Only Takes 10 Minutes to Learn The NaioAFM is the easiest-to-use atomic force microscope ever built. With built-in handling support like the cantilever alignment chip, you don’t even need perfectly steady hands to set up this AFM for measurement. It doesn’t even require laser alignment – just connect everything, place a cantilever and your sample, and you’ll have your first results in minutes.