... spatial distribution and time evolution of the magnetization state in magnetic materials and devices, and is suitable for testing and product development of magnetic materials and spintronic devices. The magneto-optical ...
Resolution: 0.02 µm
... Product overview
The Atomic Force
Microscope (wafer-level AFM) is a high-resolution scanning probe instrument designed to characterize three-dimensional surface morphology and multifunctional properties of conductors, semiconductors ...
... the product quality in industrial application, casting, smelting, heat treatment’s research of materials metallographic structure; Usage This metallographic microscope is mainly used for metal identification ...
Magnification: 195 unit - 2,830 unit
... Product overview
The MICROLAB 250E is a computerised
microscope system designed for quantitative and qualitative analysis of fibres, yarns and non‑woven
materials. It integrates image acquisition, measurement, ...
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