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- Orientation measuring system
Orientation measuring systems
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... sufficient and previous knowledge in surveying is not required! Graphical Display As a matter of principle, layouts and points are always displayed graphically. This alleviates orientation at a job ...
... measurement of 3D components. Various Measuring Applications with a Wide FOV The iNEXIV VMA series provides three types of measurement envelope together with wide field of view optics. These touch probe-ready systems ...
Nikon Metrology
... capable of high-speed, high-resolution, 3D inspection. Ground-Breaking, Multi-Functional, Confocal Video Measuring System This measuring system incorporates confocal ...
Nikon Metrology
... capable of high-speed, high-resolution, 3D inspection. Ground-Breaking, Multi-Functional, Confocal Video Measuring System This measuring system incorporates confocal ...
Nikon Metrology
... software, parts can be analyzed by comparing point cloud scans with nominal CAD models and GD&T controls. Statistical process control (SPC) data can drive warnings to reduce variability and scrap. Graphical Part Inspection ...
... Hinds™ Instruments Exicor® OIA is the Premier Birefringence Measurement System for the evaluation of Lenses, Parallel Faced Optics and Curved Optics at normal and oblique incident angles. The system ...
Hinds Instruments
The MT Systems are the modular units of the Exicor® birefringence measurement system family of products. The MT systems are only sold to OEM customers who buy in volume ...
Hinds Instruments
... research lab, school and company. Features: X-ray crystal orientation instrument operates simply, don’t need too professional acknowledge or technology, digital displays measuring ...
Liaodong Radioactive Instrument
... value of crystal bar after orientation measurement, and can accurately measure out angle value of partial wafer. Structure: YX-6D silicon single crystal orientation instrument consists ...
Liaodong Radioactive Instrument
... value of crystal bar after orientation measurement, and can accurately measure out angle value of partial wafer. Structure: YX-5D silicon single crystal orientation instrument consists ...
Liaodong Radioactive Instrument
... used matches with YX-5D, YX-6D/6DA crystal orientation instrument and multiple line cutting device. It can used for calculate X & Y deflection angle bar’s splice after orientation measurement, ...
Liaodong Radioactive Instrument
... used matches with YX-5D, YX-6D/6DA crystal orientation instrument and multiple line cutting device. It can used for calculate X & Y deflection angle bar’s splice after orientation measurement, ...
Liaodong Radioactive Instrument
YX-10 model sapphire mound orientation instrument is professionally used for crystal orientation of sapphire blank. The blank crystal of sapphire need to be processed into C surface or ...
Liaodong Radioactive Instrument
YX-9 model sapphire orientation splice instrument: Mainly used for orientation and splice of sapphire crystal bar which before cutting, it adjusts X-axis and Y-axis of crystal bar by professionally designed ...
Liaodong Radioactive Instrument
... germanium(111, 110) and others.(User can select crystal orientation angle when purchasing) Features: One of advantages for this instrument is high measuring accuracy. Orientation ...
Liaodong Radioactive Instrument
YX-2H8 Model Big Crystal Bar Orientation Instrument is designed for multiple crystal l(single crystal silicon, sapphire, gallium etc) based on standard orientation instrument, mainly ...
Liaodong Radioactive Instrument
YX-4 high precision indicator is professionally designed according to high testing precision of crystal. It applies pre-pose quartz crystal mono-chromator, improved the testing definition through double diffraction way. Its precision ...
Liaodong Radioactive Instrument
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