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... , crystal orientation analysis Residual Stress analysis, Texture and pole figures, micro X-ray Diffraction, Wide Angle X-ray Scattering (WAXS), Total scattering analysis: Bragg Diffraction, Pair-Distribution ...
... needed to complement our existing characterization facilities. It is very easy to use and versatile. The ability to collect the WAXS data simultaneously with the SAXS data is certainly an advantage. The modular features ...
Xenocs
... added capabilities, flexibility and ease-of-use. Characterize the nanostructure of soft-matter and nanomaterials using SAXS/WAXS and USAXS technique in transmission or grazing incidence mode. – Particle size distribution ...
Xenocs
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