High temperature thermal shock chamber TS series
low-temperaturerapidfor rapid temperature cycling

High temperature thermal shock chamber - TS series - AI SI LI (China) Test Equipment Co., Ltd - low-temperature / rapid / for rapid temperature cycling
High temperature thermal shock chamber - TS series - AI SI LI (China) Test Equipment Co., Ltd - low-temperature / rapid / for rapid temperature cycling
High temperature thermal shock chamber - TS series - AI SI LI (China) Test Equipment Co., Ltd - low-temperature / rapid / for rapid temperature cycling - image - 2
High temperature thermal shock chamber - TS series - AI SI LI (China) Test Equipment Co., Ltd - low-temperature / rapid / for rapid temperature cycling - image - 3
High temperature thermal shock chamber - TS series - AI SI LI (China) Test Equipment Co., Ltd - low-temperature / rapid / for rapid temperature cycling - image - 4
High temperature thermal shock chamber - TS series - AI SI LI (China) Test Equipment Co., Ltd - low-temperature / rapid / for rapid temperature cycling - image - 5
High temperature thermal shock chamber - TS series - AI SI LI (China) Test Equipment Co., Ltd - low-temperature / rapid / for rapid temperature cycling - image - 6
High temperature thermal shock chamber - TS series - AI SI LI (China) Test Equipment Co., Ltd - low-temperature / rapid / for rapid temperature cycling - image - 7
High temperature thermal shock chamber - TS series - AI SI LI (China) Test Equipment Co., Ltd - low-temperature / rapid / for rapid temperature cycling - image - 8
High temperature thermal shock chamber - TS series - AI SI LI (China) Test Equipment Co., Ltd - low-temperature / rapid / for rapid temperature cycling - image - 9
High temperature thermal shock chamber - TS series - AI SI LI (China) Test Equipment Co., Ltd - low-temperature / rapid / for rapid temperature cycling - image - 10
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Characteristics

Options
low-temperature, for high temperatures, for rapid temperature cycling, rapid

Description

Overview
The TS Series JEDEC22-A104 thermal cycling and thermal shock chamber combines thermal cycling, rapid temperature change and thermal shock capabilities in a single platform for reliability testing of semiconductors, ICs, PCBs and electronic assemblies. The system supports humidity control during high-temperature or linear temperature-change profiles and offers modular configurations to match production or laboratory workflows.

Key Functions
  • Integrated thermal cycling, rapid temperature change and thermal shock testing
  • Optional humidity control during high-temperature or linear-change tests
  • Three low-temperature grades (Type A/B/C) with optional high-temperature up to +200 °C
  • Touch-screen control and RS-232 / RS-485 communication for data logging and automation

Configurations
  • Two-chamber — Basket transfer (vertical stack): sample basket moves between hot and cold chambers for fast transfer and high throughput; suited to batch cycling and production screening
  • Single-chamber — Static sample (airflow switching): high-speed hot/cold airflow switching while sample remains stationary; suited to delicate or wired DUTs to avoid mechanical stress

What This System Delivers (Features)
  • Speed: recovery ≤ 5 min, conversion ≤ 5 s to meet IEC/EN test profiles
  • Coverage: temperature grades down to −65 °C; optional +200 °C high-temperature capability
  • Cycling: programmable up to 999 cycles and up to 999 hours per step
  • Control: graph-based touch-screen interface; RS-232 / RS-485 for logging and automation
  • Cooling: binary/semi-hermetic double-stage cooling with water-cooled or air-cooled compressor options
  • Operation modes: automatic and manual shock modes

Standards Compliance
  • EN 60068-2-14 / IEC 60068-2-14 (Change of Temperature)
  • GB/T 2423.22
  • MIL-STD-810G / MIL-STD-810F
  • ISO 16750-4
  • JESD22-A104 (Temperature Cycling) and JESD22-A106 (Thermal Shock)

Deliverables & Service
  • Installation and operation manual with wiring diagrams and setup checklist
  • Export packing list and standard shipping documentation
  • 12-month warranty covering chamber, refrigeration system and controller; lifetime remote technical support
  • Standard lead time: ~20 working days; customized builds: 30–40 working days

TS Series — Five model comparison
  • TS-49 (internal 400×350×350 mm) — approx. 450 kg
  • TS-80 (internal 500×400×400 mm) — approx. 600 kg
  • TS-150 (internal 600×500×500 mm) — approx. 750 kg
  • TS-252 (internal 700×600×600 mm) — approx. 950 kg
  • TS-450 (internal 800×750×750 mm) — approx. 1200 kg

Applications
  • Reliability testing of semiconductor devices and ICs
  • PCB and electronic assembly validation
  • Automotive electronic component qualification
  • Aerospace component and material testing
  • Materials testing for metals, plastics, rubber and composites
  • Research laboratories and certification bodies

Technical specifications
  • Temperature grades: Type A −40 °C; Type B −55 °C; Type C −65 °C; high temp +150 °C standard, +200 °C optional
  • Recovery time: ≤ 5 minutes; conversion time: ≤ 5 seconds
  • Control accuracy / uniformity: ±0.5 °C / ±2 °C
  • Inner material: SUS 304 stainless steel; outer: stainless or painted cold-rolled steel
  • Insulation: high-density, high-temperature resistant foam
  • Control system: PID + SSR + microcomputer balanced control; touch-screen; RS-232/RS-485
  • Cooling: semi-hermetic or hermetic double-stage compressors (water-cooled or air-cooled)
  • Safety: circuit breaker, high/low pressure switches, failure alarm, over-temperature and water shortage protection
  • Power options: AC 220 V single-phase or AC 380 V three-phase
  • Warranty: 12 months; lifetime remote technical support

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.
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