Performance test system HATINA GP

for automotive applicationsfor the electronics industryintegrated circuit

Product Overview
The HATINA GP is an automated test equipment (ATE) platform designed for high-parallelism production and characterization of Smart Power ICs and SoCs. The system features a modular mainframe configurable up to 10 slots, integrating analog/power sources, digital channels and advanced measurement instruments into a compact, energy-efficient platform. Control is provided via an intuitive graphical interface; Kronos software enables automated test program generation to accelerate development and production setup.

Key Capabilities
HATINA GP supports a flexible instrument mix per slot, combining high-speed digital channels, high-current DC power supplies and precision measurement units. The modular mainframe simplifies instrument replacement and scaling. Per-slot resources include high-speed digital I/O, PPMU and active loads, high-current DCS modules, AWG, digitizer and differential meters. The system is suitable for both wafer-level and packaged-device test flows.

Reasons Why

• Integrated multiplexer reduces load-board complexity
• Parallel test efficiency >99% to minimize cost of test (COT)
• Modular instrumentation enables alignment with market and technology needs
• Compact footprint and reduced power consumption to optimize operational costs
• Automated test program generation with Kronos to shorten test development time

Overview / Use Cases
Designed for high-parallelism testing of ASICs, PMICs, Smart Power ICs/SoCs in automotive, industrial and power-management sectors. Supports wafer-level probing and packaged device handlers; simplifies load-board design and integrates into automated production lines. Typical per-slot resources: digital channels (up to 256 CH per slot; some boards support higher speeds up to referenced per-slot values), high-current DC sources, precision measurement modules, AWG and digitizer.

Specification Summary

• Model family: HATINA GP (general-purpose ATE)
• Mainframe: modular, up to 10 slots
• Dimensions (D×W×H): 640 mm × 670 mm × 700 mm
• DCS HP: 16 channels, ±80 V / ±10 A, floating
• DCS LP: 160 channels, -80 V / +110 V @ ±200 mA
• DCS MP: 80 channels, -80 V / +110 V @ ±4 A
• Digital: up to 256 digital channels per slot; 256 CH per board; PPMU; active load
• Pattern memory: 64M per pin (up to 128M)
• Memory depth: 64M vectors DSIO / HRAM per pin
• AWG: 16 channels, 400 MSPS
• Digitizer / TMS: 16 channels, 80 MSPS
• Differential Voltage Meter: 16 channels
• Per-slot digital channels: board-dependent (referenced up to 800 MHz in detailed materials)
• Software: Kronos automated test program toolset integrated