Optical profilometer LEXT OLS5500
laser scanningwhite light interferometry

Optical profilometer - LEXT OLS5500 - Evident - Olympus Scientific Solutions - laser scanning / white light interferometry
Optical profilometer - LEXT OLS5500 - Evident - Olympus Scientific Solutions - laser scanning / white light interferometry
Optical profilometer - LEXT OLS5500 - Evident - Olympus Scientific Solutions - laser scanning / white light interferometry - image - 2
Optical profilometer - LEXT OLS5500 - Evident - Olympus Scientific Solutions - laser scanning / white light interferometry - image - 3
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Characteristics

Technology
optical, laser scanning, white light interferometry

Description

Product Overview
  • The LEXT™ OLS5500 hybrid 3D optical profilometer unites laser scanning microscopy (LSM), white light interferometry (WLI), and focus variation microscopy (FVM) in one powerful platform.

Key Features
  • Hybrid 3D optical profilometer
  • Combines LSM, WLI, and FVM technologies

Caractéristiques / spécifications techniques
  • Product type: 3D Optical Profilometer
  • Model: LEXT OLS5500
  • Technologies: Laser Scanning Microscopy (LSM), White Light Interferometry (WLI), Focus Variation Microscopy (FVM)

Catalogs

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Exhibitions

Meet this supplier at the following exhibition(s):

IMTS 2026
IMTS 2026

14-19 Sep 2026 Chicago (USA - Illinois) Hall East Level 3 - Stand 134546

*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.