optical, laser scanning, white light interferometry
Description
Product Overview
The LEXT™ OLS5500 hybrid 3D optical profilometer unites laser scanning microscopy (LSM), white light interferometry (WLI), and focus variation microscopy (FVM) in one powerful platform.
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.
About DirectIndustry
DirectIndustry is a marketplace that offers B2B players a complete experience, from product sourcing to purchase. DirectIndustry is an entity of VirtualExpo Group.