X-ray fluorescence spectrometer FISCHERSCOPE® 5000

processmeasurementfor analysis

Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system. Continuous and smart quality control. Designed for maximum uptime, the FISCHERSCOPE® X-RAY 5000 series convinces among other things with a high degree of customization and outstanding measurement performance - non-contact, non-destructive and precise. The devices of this series form modular units, which is why they can be easily installed as pure components in an existing plant. Tailor-made. Easy integration, individually adaptable to your application Does not break a sweat. Sample temperatures up to 250 °C (482 °F) thanks to water cooling DPP+ digital pulse processor. Shorter measuring times or improvement of standard deviation* Robust and reliable. No moving parts Compact design. Measuring head with all necessary components in one unit Vacuum compatible. Can be mounted on vacuum chambers