- Metrology - Laboratory >
- Analytical Instrumentation >
- XRF spectrometer >
- HELMUT FISCHER
HELMUT FISCHER XRF spectrometers
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... precious metal analysis as well as coating thickness measurement on simple shaped samples and RoHS screening. The right XRF device for every application. Whether PIN detector, silicon drift detector, fixed sample support or manually ...
HELMUT FISCHER SRL
... Analysis, value determination and authenticity check. Compact and robust XRF benchtop instrument for fast, cost-effective and non-destructive analysis of jewelry, coins and precious metals. Cost-effective X-ray fluorescence analysis ...
HELMUT FISCHER SRL
... Analysis, value determination and authenticity check. Robust XRF benchtop device optimized for the most powerful, fast and non-destructive analysis of jewelry, coins and precious metals, also suitable for larger parts. X-ray fluorescence ...
HELMUT FISCHER SRL
... DCM method Universal X-ray fluorescence analysis for very thin layers. The FISCHERSCOPE® X-RAY XDAL® 600 is the universal XRF analyzer from Fischer for the determination of thin layers, trace elements and alloys. With top down measurement, ...
HELMUT FISCHER SRL
... Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis. Adjustment of the measuring distance through patented DCM method Type approved full protection ...
HELMUT FISCHER SRL
... Your entry into automated measuring. Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts. Adjustment of the measuring distance through patented DCM method Type ...
HELMUT FISCHER SRL
... The best detectors for thin layers. Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range. X-ray fluorescence analysis for higher demands. Thin, thinner, XDAL®: Thanks to the ...
HELMUT FISCHER SRL
... The high-end allrounder. Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits. X-ray fluorescence analysis for universally highest demands. The FISCHERSCOPE® X-RAY XDV®-SDD ...
HELMUT FISCHER SRL
... Smallest measuring surface, greatest precision. Universal instrument for measuring on smallest and flat components and structures as well as complex multilayer systems. For the highest demands down to the smallest µ. The FISCHERSCOPE® X-RAY XDV®-µ ...
HELMUT FISCHER SRL
... Smallest measuring spot, largest measuring distance. Mastering demanding measuring tasks with polycapillaries: High-end XRF measuring device with polycapillary X-ray optics for measuring on smallest components with smallest measuring ...
HELMUT FISCHER SRL
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