X-ray fluorescence spectrometer FISCHERSCOPE® XAN®

laboratorymeasurement

The system for a wide range of applications. Universal instrument for metal and precious metal analysis as well as coating thickness measurement on simple shaped samples and RoHS screening. The right XRF device for every application. Whether PIN detector, silicon drift detector, fixed sample support or manually operated XY-table: The FISCHERSCOPE® X-RAY XAN® offers versatile applications and is adapted to your needs. This enables precise material analysis of precious metal and gold alloys, coating thickness measurement or trace analysis. The instrument version with the 50 mm² silicon drift detector is also suitable for RoHS measuring. Versatile. For trade, industry and laboratory applications Quick-measure design. The sample is placed and ready for measurement in just a few steps Commissioning. Extremely fast and simple RoHS analysis. Reliable determination of hazardous substances DPP+ digital pulse processor*. Even shorter measuring times with the same standard deviation** *not with FISCHERSCOPE® X-RAY XAN® 215 *compared to the DPP