X-ray fluorescence spectrometer FISCHERSCOPE® XDAL® 600

measurementfor electronics

Determination of thin films, trace elements and alloys. Universal instrument for measuring on smallest structures, very thin multilayer coatings, functional coatings and very thin coatings ≤ 0.1 µm. Up to 50% ¹ improved performance thanks to DPP+ Manual adjustable sample table for fast and easy probe positioning Adjustment of the measuring distance through patented DCM method Universal X-ray fluorescence analysis for very thin layers. The FISCHERSCOPE® X-RAY XDAL® 600 is the universal XRF analyzer from Fischer for the determination of thin layers, trace elements and alloys. With top down measurement, the sample is simply placed on the manually operated shear table. A laser pointer serves as a positioning aid. This means that even samples with complex geometries can be analyzed precisely and easily. Versatile. Ideal for electronics and semiconductor industry RoHS analysis. Reliable determination of hazardous substances Quick-measure design. The sample is placed and ready for measurement in just a few steps Balanced. Optimal cost-benefit ratio DPP+ digital pulse processor. Shorter measuring times or improvement of standard deviation*