X-ray fluorescence spectrometer FISCHERSCOPE® XDLM®

measurementmonitoringinspection

Your entry into automated measuring. Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts. Adjustment of the measuring distance through patented DCM method Type approved full protection device PC-detector with largest measuring window on the market Equipped with a microfocus tube, multiple aperture and primary filter changer, the XDLM® series is the best choice to inspect many small parts one after the other. The instruments are closely related to the , with only one significant difference: measuring direction from top down! This means: convenient analysis of uneven samples as well as the possibility of automated measuring and therefore predestined for quality assurance, incoming goods inspection and production monitoring. As a special solution for PCBs, the device is available as . Commissioning. Extremely fast and simple Tailor-made. Different models offer the optimal solution for your application Testing of multiple measuring points. Even with large samples, measuring points are possible on the entire sample surface Also for large samples. Hood with C-slot Built to last. Robust design for measurement on mass parts Quick-measure design. The sample is placed and ready for measurement in just a few steps