X-ray fluorescence spectrometer FISCHERSCOPE® XDV®-µ

automaticmeasurementhigh-precision

Smallest measuring surface, greatest precision. Universal instrument for measuring on smallest and flat components and structures as well as complex multilayer systems. For the highest demands down to the smallest µ. The FISCHERSCOPE® X-RAY XDV®-µ instruments are among Fischer's high-end X-ray fluorescence measuring devices and are ideal for measuring tiny structures. They are equipped with the latest generation of powerful silicon drift detectors, microfocus tubes Ultra and in-house produced polycapillary optics. Due to the high radiation intensity, measuring times are drastically reduced and highly precise measurements on the smallest measuring spots are possible. Meeting all challenges. Reliable and fast results for ambitious measurement Most advanced polycapillary optics on the market. Our in-house manufactured polycapillary optics deliver outstanding measurement results with short measuring times Accurate and precise. Positioning of the measuring point on small structures thanks to automatic image recognition Fully automatable. Let your instrument work for you with just one click DPP+ digital pulse processor. Shorter measuring times or improvement of standard deviation*