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HELMUT FISCHER spectrometers
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The Fischeroscope® X-ray Xul® series is designed with a compact x-ray fluorescence spectrometers used for conducting thickness measurements and material analysis. It is intended to be utilized in electroplating industries ...
HELMUT FISCHER GMBH - INSTITUT FÜR ELEKTRONIK UND
The XAN 220, manufactured by Fischer, is a X-ray fluorescence measuring instrument for fast and non-destructive analysis of gold and silver alloys. It can deliver comparable results as cupellation without destroying the sample. It also ...
HELMUT FISCHER GMBH - INSTITUT FÜR ELEKTRONIK UND
X-ray fluorescence is a measuring instrument which is used for manual or automated coating thickness on functional coatings, corrosion, safety coatings and parts produced in bulk. It’s a durable instrument which is well suited for structure ...
HELMUT FISCHER GMBH - INSTITUT FÜR ELEKTRONIK UND
The FISCHERSCOPE® X-RAY XDAL® is mainly designed to provide a good quality performance and functionality for very specific purposes. It is highly constructed with several PIN detectors which offer a very reliable analysis result. It is ...
HELMUT FISCHER GMBH - INSTITUT FÜR ELEKTRONIK UND
The Fischerscope® X-ray XDV®-SDD is a high-performance X-ray fluorescence gauging unit that has a configurable X/Y-stage and Z-axis which is suitable for use in non-destructive mechanized measurements of thin coatings and as well as ...
HELMUT FISCHER GMBH - INSTITUT FÜR ELEKTRONIK UND
Fischer's FischerSchope® XDV®-µ is an X-ray fluorescence-calculating system, integrated with polycapillary x-ray optics. This optics unit is generally utilized for automated measurement applications. It is also used for general evaluation ...
HELMUT FISCHER GMBH - INSTITUT FÜR ELEKTRONIK UND
Handheld, desktop, inline: the XAN®500 X-ray fluorescence instrument is Fischer’s most versatile yet. It can be used as a handheld device, as a fully enclosed desktop unit or integrated directly into production lines. Equipped with a ...
HELMUT FISCHER GMBH - INSTITUT FÜR ELEKTRONIK UND
The FISCHERSCOPE® X-RAY 5000 is an x-ray fluorescence (XRF) measuring system designed for constant in-line analysis and measurement of thin coatings. It is manufactured with a proportional counter pipe and a silicon drift sensor. The ...
HELMUT FISCHER GMBH - INSTITUT FÜR ELEKTRONIK UND
Fischer's XULM®-PCB Energy Dispersive X-Ray Fluorescence (EDXRF) Spectrometer is used for printed circuit board coating thickness and composition measurements and analyses. Up to 24-in x 24-in (610-mm x 610-mm) circuit ...
HELMUT FISCHER GMBH - INSTITUT FÜR ELEKTRONIK UND
Fischer PCB testing machines harness the innovative X-Ray Fluorescence technology to deliver precise and efficient measuring/analyzing of thickness of coating and composition of PCBs. The machine can competently handle printed circuit ...
HELMUT FISCHER GMBH - INSTITUT FÜR ELEKTRONIK UND
Entry-level model with focus on time saving. Robust entry-level instrument for measuring the coating thickness and determining the metal content in electroplating baths as well as the composition of simple alloy coatings. X-ray fluorescence ...
HELMUT FISCHER SRL
Entry-level model with focus on time saving. Flexible measuring devices for coating thickness measurement of filigree parts like plugs, contacts or wires as well as for the determination of the metal content of electroplating baths and ...
HELMUT FISCHER SRL
The system for a wide range of applications. Universal instrument for metal and precious metal analysis as well as coating thickness measurement on simple shaped samples and RoHS screening. The right XRF device for every application. Whether ...
HELMUT FISCHER SRL
Analysis, value determination and authenticity check. Compact and robust XRF benchtop instrument for fast, cost-effective and non-destructive analysis of jewelry, coins and precious metals. Cost-effective X-ray fluorescence analysis ...
HELMUT FISCHER SRL
Analysis, value determination and authenticity check. Robust XRF benchtop device optimized for the most powerful, fast and non-destructive analysis of jewelry, coins and precious metals, also suitable for larger parts. X-ray fluorescence ...
HELMUT FISCHER SRL
Determination of thin films, trace elements and alloys. Universal instrument for measuring on smallest structures, very thin multilayer coatings, functional coatings and very thin coatings ≤ 0.1 µm. Up to 50% ¹ improved performance ...
HELMUT FISCHER SRL
Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis. Adjustment of the measuring distance through patented DCM method Type approved full protection ...
HELMUT FISCHER SRL
Your entry into automated measuring. Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts. Adjustment of the measuring distance through patented ...
HELMUT FISCHER SRL
The best detectors for thin layers. Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range. X-ray fluorescence analysis for higher demands. Thin, thinner, XDAL®: ...
HELMUT FISCHER SRL
The high-end allrounder. Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits. X-ray fluorescence analysis for universally highest demands. The FISCHERSCOPE® ...
HELMUT FISCHER SRL
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