Fluorescence spectrometer X-RAY XDV-SDD

X-ray fluorescenceprocessfor coating

The Fischerscope® X-ray XDV®-SDD is a high-performance X-ray fluorescence gauging unit that has a configurable X/Y-stage and Z-axis which is suitable for use in non-destructive mechanized measurements of thin coatings and as well as for tiny concentrations trace analysis. The coating that the unit can analyze includes gold,palladium and any other precious metal that measures ≤0.1 μm. The unit operates based on the specifications of RoHS and WEEE standards. It is also ideal for gauging function coatings in the electronics and in the semi-conductor industries. The Fischerscope® X-ray XDV®-SDD is integrated with interchangeable apertures, primary filters and as well as a rapid pulse processor. It also comes with a silicon drift detector which attains a highly accurate analysis, and adequate spotting sensitivity.