Fluorescence spectrometer X-RAY XDV®-µ

X-ray fluorescencelaboratorymeasurement

Fischer's FischerSchope® XDV®-µ is an X-ray fluorescence-calculating system, integrated with polycapillary x-ray optics. This optics unit is generally utilized for automated measurement applications. It is also used for general evaluation of coating thicknesses and compositions on compact materials and structures. Common fields of application the FischerSchope® XDV®-µ can be used in include PC boards, leadframes, wafers, thin wires, and more. The FischerSchope® XDV®-µ exhibits a wide range of analysis-related features. This includes a micro-analysis system via optimization functions, 100-µm or less analysis capabilities, and comprehensive intensity levels. It also features a < 1-nm measurement uncertainty rate, and a measurement chamber compete with a cutout portion (C-slot).