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  1. Metrology - Laboratory
  2. Analytical Instrumentation
  3. EDXRF spectrometer
  4. HELMUT FISCHER GMBH - INSTITUT FÜR ELEKTRONIK UND
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Fluorescence spectrometer X-RAY 5000
EDXRFprocess

fluorescence spectrometer
fluorescence spectrometer
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Characteristics

Type
fluorescence, EDXRF
Field
process

Description

The FISCHERSCOPE® X-RAY 5000 is an x-ray fluorescence (XRF) measuring system designed for constant in-line analysis and measurement of thin coatings. It is manufactured with a proportional counter pipe and a silicon drift sensor. The unit can be quickly and easily calibrated during production processes and can obtain measurements even on hot materials of up to 500°C. Features • Flange measuring head for continuous measurements in production lines • Proportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detector • Quick and easy calibration on a workpiece master directly in the production process • For use in air or vacuum • Allows measurements even on very hot substrate materials up to 500° C (930° F) • Design is focused on maximum robustness and serviceability Typical fields of application • Photovoltaics (CIGS, CIS, CdTe) • Analysis of thin coatings on metal strip, metal foils and plastic films • Continuous production • Process monitoring of sputter and electroplating production lines • Large-area measurement
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