Quadrupole spectrometer EQS

secondary ion massfor analysishigh-sensitivity

A system for the analysis of secondary positive and negative ions from solid samples Hiden Analytical supplies world-class mass spectrometry solutions and innovative tools for ion analyses, including the tried-and-trusted Hiden EQS. This high transmission electrostatic quadrupole secondary ion mass spectrometer (SIMS) is one of our most popular detection systems for research-scale thin film nanoscale surface analysis. The EQS SIMS analyser is an ideal add-on analyser for XPS and focused ion beam FIB microscopy systems. FIB-SIMS for Nano-Scale Materials Analysis Battery Research Nuclear Materials UHV Surface Science The Hiden EQS is a unique electrostatic quadrupole SIMS detector, specialised for the mass spectral analysis of both positive (+ve) and negative (-ve) secondary ions from solid samples. With its integrated 45° electrostatic sector ion energy analyser, the Hiden EQS can simultaneously analyse ion energy with a resolution of 0.2 electron volts (eV). This makes it one of the most versatile tools for ion analyses in a raft of mass spectrometry applications, including: Extending the sensitivity range of XPS by a factor of over 1000 Dynamic and static SIMS Focussed ion beam (FIB) mass spectrometry Secondary neutral mass spectrometry (SNMS) Sputter depth profiling Sputtered ion and neutral mass/energy analysis A popular bolt-on fitting for after-market systems, ideal as an add-on for XPS systems and focused ion beam FIB microscopy systems for example, the Hiden EQS offers high sensitivity and optional differential pumping to meet the imaging, depth profiling, and mass spectra requirements of users in a range of applications.