Raman spectrometer Raman AFM and nano-Raman TERS

micro-spectroscopy

HORIBAs Raman technology is easily coupled to scanning probe microscopes (SPM). The Platform allows Atomic Force Microscopy (AFM), near-field optical techniques (SNOM, NSOM), Scanning Tunneling Microscopy (STM) and confocal optical spectroscopy (Raman and Fluorescence Imaging) in one versatile instrument, ready for Tip-Enhanced Raman Spectroscopy (TERS) or co-localized measurements. The exceptional long-term stability and speed of our integrated Raman-AFM Platform bring reliable results both for co-localized measurements and TERS Imaging. A unique Platform for simultaneous measurements ensures the images you get are truly correlated.