fast-response, reference, with integrated electronics
Temperature
Max.: 80 °C (176 °F)
Min.: -40 °C (-40 °F)
Probe diameter
2.2 mm (0.0866 in)
Response time
30,000 ms
Description
Description
Short high-precision digital reference probe designed for efficient calibration operations and measurements in constrained environments.
Compliant with FDX 15140 and IEC 60068 standards; optimized response time for loudspeaker characterization.
Internal memory stores calibration coefficients; calibration possible by probe exchange or via the JRI-MySirius Calibration module.
Error modeling using integrated X² function is included in the JRI calibration certificate; thin cable enables passage through door seals and adapts to calibration setups.
Features
Short digital reference probe for straightforward calibration procedures.
Standards: FDX 15140, IEC 60068.
Fast response time suitable for loudspeaker characterization.
Internal memory for calibration coefficients.
Calibration by probe exchange or via JRI-MySirius Calibration module.
Error modeling using integrated X² function included in the calibration certificate.
Compatibility: Nova SPY Digital, LoRa SPY Digital, Nano SPY Digital; thin cable for door-seal passage.
Compliance
Response time and metrological performance meet the requirements of FDX 15140 and IEC 60068 for loudspeaker characterization when used according to instructions.
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