Non-contact interferometry sensor WI-5000 series

The WI-5000 Series 3D interference measurement sensors capture a 3D image of target areas of up to 10 x 10 mm (0.39″ × 0.39″) in just 0.13 seconds. The sensor records 80,000 height data points across the surface simultaneously to perform high-accuracy measurements of height, coplanarity, and even surface roughness (Sa and Sz). By utilizing white light interferometry to capture images, the sensor can employ coaxial surface measurement, eliminating dead zones that prevent accurate measurement in grooves and other shapes with sharp height changes. The measurement principle enables accurate, repeatable 3D measurements on nearly any surface type, including transparent or mirrored targets. While its speed makes it ideal for inline measurements, an adjustable stand is also available, allowing users to capitalize on the same quick, automatic measurements for both inline and offline inspections. Non-contact Roughness Measurements Performed Inline Introducing the WI-5000 Series 3D Interference Measurement Sensor for instant surface height measurement. Perform inline measurement of both line and surface roughness. • Surface roughness (Sa/Sz) • Line roughness (Ra/Rz) Area Measurement, Not Point or Line Measurement Instantly measure 80000 points over a maximum measurement area of 10 × 10 mm 0.39" × 0.39". Utilizing the principles of white light interferometry, the WI-5000 Series is not affected by material type, color, or blind spots, allowing for high-accuracy, micron-level measurement.