Laser profilometer VK-X4000

optical3Dconfocal

Overview
The VK-X4000 series 3D optical profiling microscope integrates laser confocal, white light interferometry (WLI) and focus variation into a single metrology platform for non-contact, high-precision surface and topography measurement. The system supports automated multi-point routines and multi-feature detection to increase throughput while minimizing operator setup.

Key features

• Three measurement principles in one instrument: Laser Confocal, WLI and Focus Variation for wide material and geometry coverage.
• Multi-point automated measurement: define target coordinates and magnifications for unattended batch measurement across multiple parts and locations.
• Automated multi-feature measurement: identify target features and apply measurement conditions automatically for consistent results.
• AI-Analyzer: evaluates dozens of surface parameters to highlight the metrics that best differentiate samples, streamlining analysis.
• High versatility: suitable for metals, films, plastics, semiconductors, medical components and other materials.

Measurement principles and strengths

• Laser Confocal: effective for complex shapes and varied materials, delivering localized 3D data on challenging geometries.
• White Light Interferometry (WLI): provides sub-nanometer vertical resolution for very fine surface detail and precise thickness measurements.
• Focus Variation: captures fine texture over larger areas and complements other methods where transparency or slope limit performance.

Multi-Point / Automated Measurement

• Configure multiple measurement points by selecting targets; the system automatically manages positioning and objective selection.
• Run batch measurements across multiple samples and areas without repeated manual setup, reducing cycle time and operator variability.

AI-Analyzer / Roughness Analysis
The AI-Analyzer compares numerous surface parameters (e.g., Ra, Rz and standard ISO metrics) to identify which parameters most clearly distinguish sample differences, simplifying selection of roughness metrics and accelerating interpretation of results.

Applications & benefits

• 3D surface profiling and roughness analysis for electronics, precision machining, films and coatings, medical devices, plastics and more.
• Enables high-throughput inspection with reproducible, automated routines for quality control and comparative studies.
• Combines complementary measurement methods to address virtually any surface from smooth films to rough, complex geometries.

Technical specifications

• Commercial designation: VK-X4000 series
• Measurement principles: Laser Confocal, White Light Interferometry (WLI), Focus Variation
• WLI vertical resolution: sub-nanometer (for fine surface detail)
• Multi-point measurement: automated coordinate selection and batch measurement across samples
• AI-Analyzer: automated comparison of multiple surface parameters to detect key differences
• Automated multi-feature measurement: automatic application of measurement conditions to identified features
• Suitable materials: metals, films, plastics, semiconductor components, medical parts, etc.
• Primary use cases: 3D surface profiling, roughness analysis, film thickness evaluation, comparative surface analysis, high-throughput automated inspection